NXP Semiconductors
ESD TESTER
PRTR5V0U2AX
Ultra low capacitance double rail-to-rail ESD protection diode
4 GHz DIGITAL
R d
450 Ω
RG 223/U
50 Ω coax
10 ×
OSCILLOSCOPE
ATTENUATOR
C s
IEC 61000-4-2 network
C s = 150 pF; R d = 330 Ω
DUT
Device
Under
Test
PRTR5V0U2AX
50 Ω
vertical scale = 10 A/div
horizontal scale = 15 ns/div
unclamped + 8 kV ESD pulse waveform
(IEC 61000-4-2 network)
vertical scale = 10 A/div
horizontal scale = 15 ns/div
unclamped ? 8 kV ESD pulse waveform
vertical scale = 10 V/div
horizontal scale = 100 ns/div
clamped + 8 kV ESD voltage waveform
(IEC 61000-4-2 network), pin I/O to GND
vertical scale = 10 V/div
horizontal scale = 100 ns/div
clamped ? 8 kV ESD pulse waveform
Fig 3.
(IEC 61000-4-2 network)
ESD clamping test setup and waveforms
(IEC 61000-4-2 network), pin I/O to GND
006aaa680
PRTR5V0U2AX
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 15 May 2012
? NXP B.V. 2012. All rights reserved.
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